Showing results: 121 - 135 of 482 items found.
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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C8000 -
Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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LXinstruments GmbH
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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40-297-001 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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40-297-053 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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40-297-051 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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40-297-054 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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40-297-052 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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40-297-050 -
Pickering Interfaces Ltd.
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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UTP 6010 RF -
NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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ADTS-3300JS -
TestVonics, Inc.
TestVonics™ ADTS-3300JS Test Set is a portable, high precision, dual channel air data pressure management system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment, especially for military end users. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-3300JS accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.
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SofTest Designs Corporation
We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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PEM-1000 -
Korima, Inc.
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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40-297-110 -
Pickering Interfaces Ltd.
The 40-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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50-297-032 -
Pickering Interfaces Ltd.
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.